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In-line process control and optimisation tool for thin-film solar cell manufacturing

BrightView Systems of Israel has launched its InSight M Series, an in-line process control and optimisation tool developed specifically for thin-film solar cell manufacturing.

The Wide Area Metrology (WAM) system provides continuous monitoring and whole-panel mapping of critical material and process parameters at full production throughput and for 100% of manufactured thin-film solar panels.

According to BrightView, it can be used for any thin-film production line including single-junction and multi-junction silicon, and it enables enhanced average thin-film solar panel efficiency, improve line productivity and verify full compliance with the strictest durability and quality requirements.

InSight is able to measure and map critical layers on-the-fly within the actual product stack, providing continuous process fingerprinting that drives production improvement, excursion detection and line productivity, BrightView says.

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Photovoltaics (PV)  •  Solar electricity

 

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